Patterning and Characterization of Free-Standing Nanostructures in Magnetic Oxide Thin Films

dc.contributor.advisor	Grepstad, Jostein
dc.contributor.advisor	Folven, Erik
dc.contributor.author	Urnes, Marianne
dc.date.accessioned	2019-09-11T11:07:27Z
dc.date.created	2016-02-23
dc.date.issued	2016
dc.identifier	ntnudaim:14493
dc.identifier.uri	http://hdl.handle.net/11250/2615915
dc.description.abstract	Free-standing nanostructures consisting of lines measuring 650 nm wide and 4 mm long were produced over an area of 4x4 mm using electron beam lithography (EBL). The magnetic properties of the resulting structures was characterized using vibrating sample magnetometry (VSM)	en
dc.language	eng
dc.publisher	NTNU
dc.subject	Nanoteknologi, Nanoelektronikk	en
dc.title	Patterning and Characterization of Free-Standing Nanostructures in Magnetic Oxide Thin Films	en
dc.type	Master thesis	en
dc.source.pagenumber	83
dc.contributor.department	Norges teknisk-naturvitenskapelige universitet, Fakultet for informasjonsteknologi og elektroteknikk,Institutt for elektroniske systemer	nb_NO
dc.date.embargoenddate	10000-01-01