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dc.contributor.advisorGrepstad, Jostein
dc.contributor.advisorFolven, Erik
dc.contributor.authorUrnes, Marianne
dc.date.accessioned2019-09-11T11:07:27Z
dc.date.created2016-02-23
dc.date.issued2016
dc.identifierntnudaim:14493
dc.identifier.urihttp://hdl.handle.net/11250/2615915
dc.description.abstractFree-standing nanostructures consisting of lines measuring 650 nm wide and 4 mm long were produced over an area of 4x4 mm using electron beam lithography (EBL). The magnetic properties of the resulting structures was characterized using vibrating sample magnetometry (VSM)en
dc.languageeng
dc.publisherNTNU
dc.subjectNanoteknologi, Nanoelektronikken
dc.titlePatterning and Characterization of Free-Standing Nanostructures in Magnetic Oxide Thin Filmsen
dc.typeMaster thesisen
dc.source.pagenumber83
dc.contributor.departmentNorges teknisk-naturvitenskapelige universitet, Fakultet for informasjonsteknologi og elektroteknikk,Institutt for elektroniske systemernb_NO
dc.date.embargoenddate10000-01-01


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