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Patterning and Characterization of Free-Standing Nanostructures in Magnetic Oxide Thin Films

Urnes, Marianne
Master thesis
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URI
http://hdl.handle.net/11250/2615915
Date
2016
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  • Institutt for elektroniske systemer [1865]
Abstract
Free-standing nanostructures consisting of lines measuring 650 nm wide and 4 mm long were produced over an area of 4x4 mm using electron beam lithography (EBL). The magnetic properties of the resulting structures was characterized using vibrating sample magnetometry (VSM)
Publisher
NTNU

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