Patterning and Characterization of Free-Standing Nanostructures in Magnetic Oxide Thin Films
Master thesis
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http://hdl.handle.net/11250/2615915Utgivelsesdato
2016Metadata
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Sammendrag
Free-standing nanostructures consisting of lines measuring 650 nm wide and 4 mm long were produced over an area of 4x4 mm using electron beam lithography (EBL). The magnetic properties of the resulting structures was characterized using vibrating sample magnetometry (VSM)