Browsing Institutt for elektroniske systemer by Journals "IIUM Engineering Journal"
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Automated characterization of single-photon avalanche photodiode
(Journal article; Peer reviewed, 2011)We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels ...