Automated characterization of single-photon avalanche photodiode
Journal article, Peer reviewed
MetadataShow full item record
Original versionIIUM Engineering Journal. 2011, 12 (5), 97-104.
We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels (darkness, 10 pW and 10 µW), dark count rate and photon detection efficiency at different bias voltages. The automated characterization routine is implemented in C++ running on a Linux computer.