Automated characterization of single-photon avalanche photodiode
Journal article, Peer reviewed
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Date
2011Metadata
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Original version
IIUM Engineering Journal. 2011, 12 (5), 97-104.Abstract
We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels (darkness, 10 pW and 10 µW), dark count rate and photon detection efficiency at different bias voltages. The automated characterization routine is implemented in C++ running on a Linux computer.