dc.contributor.advisor | Grepstad, Jostein | |
dc.contributor.advisor | Folven, Erik | |
dc.contributor.author | Urnes, Marianne | |
dc.date.accessioned | 2019-09-11T11:07:27Z | |
dc.date.created | 2016-02-23 | |
dc.date.issued | 2016 | |
dc.identifier | ntnudaim:14493 | |
dc.identifier.uri | http://hdl.handle.net/11250/2615915 | |
dc.description.abstract | Free-standing nanostructures consisting of lines measuring 650 nm wide and 4 mm long were produced over an area of 4x4 mm using electron beam lithography (EBL). The magnetic properties of the resulting structures was characterized using vibrating sample magnetometry (VSM) | en |
dc.language | eng | |
dc.publisher | NTNU | |
dc.subject | Nanoteknologi, Nanoelektronikk | en |
dc.title | Patterning and Characterization of Free-Standing Nanostructures in Magnetic Oxide Thin Films | en |
dc.type | Master thesis | en |
dc.source.pagenumber | 83 | |
dc.contributor.department | Norges teknisk-naturvitenskapelige universitet, Fakultet for informasjonsteknologi og elektroteknikk,Institutt for elektroniske systemer | nb_NO |
dc.date.embargoenddate | 10000-01-01 | |