dc.contributor.author | Mosberg, Aleksander Buseth | |
dc.contributor.author | Ren, Dingding | |
dc.contributor.author | Fauske, Vidar Tonaas | |
dc.contributor.author | Fimland, Bjørn-Ove | |
dc.contributor.author | Van Helvoort, Antonius | |
dc.date.accessioned | 2018-08-13T08:44:19Z | |
dc.date.available | 2018-08-13T08:44:19Z | |
dc.date.created | 2018-08-12T15:53:38Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | Microscopy and Microanalysis. 2018, 24 806-807. | nb_NO |
dc.identifier.issn | 1431-9276 | |
dc.identifier.uri | http://hdl.handle.net/11250/2557639 | |
dc.language.iso | eng | nb_NO |
dc.publisher | Cambridge University Press (CUP) | nb_NO |
dc.title | Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.pagenumber | 806-807 | nb_NO |
dc.source.volume | 24 | nb_NO |
dc.source.journal | Microscopy and Microanalysis | nb_NO |
dc.identifier.doi | 10.1017/S143192761800452X | |
dc.identifier.cristin | 1601293 | |
dc.relation.project | NORTEM: 197405 | nb_NO |
dc.description.localcode | © 2018. This is the authors’ accepted and refereed manuscript to the article. Locked until 1.2.2019 due to copyright restrictions. | nb_NO |
cristin.unitcode | 194,66,20,0 | |
cristin.unitcode | 194,63,35,0 | |
cristin.unitname | Institutt for fysikk | |
cristin.unitname | Institutt for elektroniske systemer | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 | |