Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires
Mosberg, Aleksander Buseth; Ren, Dingding; Fauske, Vidar Tonaas; Fimland, Bjørn-Ove; Van Helvoort, Antonius
Journal article, Peer reviewed
Accepted version
Permanent lenke
http://hdl.handle.net/11250/2557639Utgivelsesdato
2018Metadata
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