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Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires

dc.contributor.authorMosberg, Aleksander Buseth
dc.contributor.authorRen, Dingding
dc.contributor.authorFauske, Vidar Tonaas
dc.contributor.authorFimland, Bjørn-Ove
dc.contributor.authorVan Helvoort, Antonius
dc.date.accessioned2018-08-13T08:44:19Z
dc.date.available2018-08-13T08:44:19Z
dc.date.created2018-08-12T15:53:38Z
dc.date.issued2018
dc.identifier.citationMicroscopy and Microanalysis. 2018, 24 806-807.nb_NO
dc.identifier.issn1431-9276
dc.identifier.urihttp://hdl.handle.net/11250/2557639
dc.language.isoengnb_NO
dc.publisherCambridge University Press (CUP)nb_NO
dc.titleUsing FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowiresnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber806-807nb_NO
dc.source.volume24nb_NO
dc.source.journalMicroscopy and Microanalysisnb_NO
dc.identifier.doi10.1017/S143192761800452X
dc.identifier.cristin1601293
dc.relation.projectNORTEM: 197405nb_NO
dc.description.localcode© 2018. This is the authors’ accepted and refereed manuscript to the article. Locked until 1.2.2019 due to copyright restrictions.nb_NO
cristin.unitcode194,66,20,0
cristin.unitcode194,63,35,0
cristin.unitnameInstitutt for fysikk
cristin.unitnameInstitutt for elektroniske systemer
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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