Characterization of Solar Cell Wafers with Low Coherence Interferometry

dc.contributor.advisor	Aksnes, Astrid	nb_NO
dc.contributor.advisor	Johnsen, Lars
dc.contributor.author	Simonsen, Ove	nb_NO
dc.date.accessioned	2014-12-19T13:46:33Z
dc.date.accessioned	2015-12-22T11:45:07Z
dc.date.available	2014-12-19T13:46:33Z
dc.date.available	2015-12-22T11:45:07Z
dc.date.created	2011-09-02	nb_NO
dc.date.issued	2011	nb_NO
dc.identifier	438445	nb_NO
dc.identifier	ntnudaim:6303
dc.identifier.uri	http://hdl.handle.net/11250/2370222
dc.description.abstract	Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.	nb_NO
dc.language	eng	nb_NO
dc.publisher	Institutt for elektronikk og telekommunikasjon	nb_NO
dc.subject	ntnudaim:6303	no_NO
dc.subject	MTEL elektronikk
dc.subject	Nanoelektronikk og mikrosystemer
dc.title	Characterization of Solar Cell Wafers with Low Coherence Interferometry	nb_NO
dc.type	Master thesis	nb_NO
dc.source.pagenumber	122	nb_NO
dc.contributor.department	Norges teknisk-naturvitenskapelige universitet, Fakultet for informasjonsteknologi, matematikk og elektroteknikk, Institutt for elektronikk og telekommunikasjon	nb_NO