Characterization of Solar Cell Wafers with Low Coherence Interferometry

Simonsen, Ove
Master thesis
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http://hdl.handle.net/11250/2370222
Date
2011
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Abstract
Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.
Publisher
Institutt for elektronikk og telekommunikasjon