Browsing Institutt for elektroniske systemer by Journals "Microscopy and Microanalysis"
Now showing items 1-2 of 2
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Atomap - Automated Analysis of Atomic Resolution STEM Images
(Journal article, 2017)Atomic resolution scanning transmission electron microscopy (STEM) data contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large ... -
Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires
(Journal article; Peer reviewed, 2018)