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dc.contributor.authorRokosz, Krzysztof
dc.contributor.authorHryniewicz, Tadeusz
dc.contributor.authorMatysek, Dalibor
dc.contributor.authorRaaen, Steinar
dc.contributor.authorValicek, Jan
dc.contributor.authorDudek, Lukasz
dc.contributor.authorHarnicarova, Marta
dc.date.accessioned2020-03-04T12:00:02Z
dc.date.available2020-03-04T12:00:02Z
dc.date.created2016-04-27T14:42:41Z
dc.date.issued2016
dc.identifier.citationMaterials. 2016, 9 (5), .nb_NO
dc.identifier.issn1996-1944
dc.identifier.urihttp://hdl.handle.net/11250/2645202
dc.description.abstractIn the paper, the Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray Spectroscopy (EDS) and X-ray Photoelectron Spectroscopy (XPS) results of the surface layer formed on pure titanium after plasma electrolytic oxidation (micro arc oxidation) at the voltage of 450 V are shown. As an electrolyte, the mixture of copper nitrate Cu(NO3)2 (10–600 g/L) in concentrated phosphoric acid H3PO4 (98 g/mol) was used. The thickness of the obtained porous surface layer equals about 10 μm, and it consists mainly of titanium phosphates and oxygen with embedded copper ions as a bactericidal agent. The maximum percent of copper in the PEO surface layer was equal to 12.2 ± 0.7 wt % (7.6 ± 0.5 at %), which is the best result that the authors obtained. The top surface layer of all obtained plasma electrolytic oxidation (PEO) coatings consisted most likely mainly of Ti3(PO4)4∙nH3PO4 and Cu3(PO4)2∙nH3PO4 with a small addition of CuP2, CuO and Cu2O.nb_NO
dc.language.isoengnb_NO
dc.publisherMDPInb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleSEM, EDS and XPS Analysis of the Coatings Obtained on Titanium after Plasma Electrolytic Oxidation in Electrolytes Containing Copper Nitratenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber12nb_NO
dc.source.volume9nb_NO
dc.source.journalMaterialsnb_NO
dc.source.issue5nb_NO
dc.identifier.doi10.3390/ma9050318
dc.identifier.cristin1352789
dc.description.localcode© 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/).nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal