dc.contributor.author | Lu, Hao | |
dc.contributor.author | Paletti, Paolo | |
dc.contributor.author | Li, Wenjun | |
dc.contributor.author | Fay, Patrick | |
dc.contributor.author | Ytterdal, Trond | |
dc.contributor.author | Seabaugh, Alan | |
dc.date.accessioned | 2020-02-07T07:52:07Z | |
dc.date.available | 2020-02-07T07:52:07Z | |
dc.date.created | 2018-05-29T14:04:32Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC). 2018, 4 (1), . | nb_NO |
dc.identifier.issn | 2329-9231 | |
dc.identifier.uri | http://hdl.handle.net/11250/2640137 | |
dc.description.abstract | A platform for benchmarking tunnel field-effect transistors (TFETs) for analog applications is presented and used to compare selected TFETs to FinFET technology at the 14-nm node. This benchmarking is enabled by the development of a universal TFET SPICE model and a parameter extraction procedure based on data from physics-based device simulators. Analog figures of merit are computed versus current density to compare TFETs with CMOS for low-power analog applications to reveal promising directions for the system development. To illustrate the design space enabled by TFETs featuring sub-60-mV/decade subthreshold swing, two example circuits including a picopower common-source amplifier and an ultralow-voltage ring oscillator are demonstrated. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | nb_NO |
dc.title | Tunnel FET Analog Benchmarking and Circuit Design | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | publishedVersion | nb_NO |
dc.subject.nsi | VDP::Matematikk og naturvitenskap: 400 | nb_NO |
dc.subject.nsi | VDP::Mathematics and natural scienses: 400 | nb_NO |
dc.source.pagenumber | 7 | nb_NO |
dc.source.volume | 4 | nb_NO |
dc.source.journal | IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JXCDC) | nb_NO |
dc.source.issue | 1 | nb_NO |
dc.identifier.doi | 10.1109/JXCDC.2018.2817541 | |
dc.identifier.cristin | 1587470 | |
dc.relation.project | Norges forskningsråd: 237887 | nb_NO |
dc.description.localcode | 2018 IEEE. Open Access. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information. | nb_NO |
cristin.unitcode | 194,63,35,0 | |
cristin.unitname | Institutt for elektroniske systemer | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |