dc.contributor.author | Kildemo, Morten | |
dc.contributor.author | Jerome, Maria | |
dc.contributor.author | Ellingsen, Pål Gunnar | |
dc.contributor.author | Aas, Lars Martin Sandvik | |
dc.date.accessioned | 2019-10-28T09:30:01Z | |
dc.date.available | 2019-10-28T09:30:01Z | |
dc.date.created | 2013-10-16T13:20:41Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | Optics Express. 2013, 21 (15), 18509-18524. | nb_NO |
dc.identifier.issn | 1094-4087 | |
dc.identifier.uri | http://hdl.handle.net/11250/2624808 | |
dc.description.abstract | Decomposition methods have been applied to in-plane Mueller matrix ellipsometric scattering data of the Spectralon reflectance standard. Data were measured at the wavelengths 532 nm and 1500 nm, using an achromatic optimal Mueller matrix scatterometer applying a photomultiplier tube and a high gain InGaAs detector for the two wavelengths. A parametric model with physical significance was deduced through analysis of the product decomposed matrices. It is found that when the data are analyzed as a function of the scattering angle, similar to particle scattering, the matrix elements are largely independent of incidence angle. To the first order, we propose that a Guassian lineshape is appropriate to describe the polarization index, while the decomposed diagonal elements of the retardance matrix have a form resembling Rayleigh single scattering. New models are proposed for the off diagonal elements of the measured Mueller matrix. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Optical Society of America | nb_NO |
dc.title | Parametric model of the Mueller matrix of a Spectralon white reflectance standard deduced by polar decomposition techniques | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | publishedVersion | nb_NO |
dc.source.pagenumber | 18509-18524 | nb_NO |
dc.source.volume | 21 | nb_NO |
dc.source.journal | Optics Express | nb_NO |
dc.source.issue | 15 | nb_NO |
dc.identifier.doi | 10.1364/OE.21.018509 | |
dc.identifier.cristin | 1058174 | |
dc.description.localcode | © 2013 Optical Society of America. Open access. | nb_NO |
cristin.unitcode | 194,66,20,0 | |
cristin.unitname | Institutt for fysikk | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |