dc.contributor.author | Ai, Yun | |
dc.contributor.author | Kong, Long | |
dc.contributor.author | Cheffena, Michael | |
dc.date.accessioned | 2019-05-02T05:54:19Z | |
dc.date.available | 2019-05-02T05:54:19Z | |
dc.date.created | 2019-04-30T14:08:58Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | Electronics Letters. 2019, . | nb_NO |
dc.identifier.issn | 0013-5194 | |
dc.identifier.uri | http://hdl.handle.net/11250/2596204 | |
dc.description.abstract | The double shadowed Rician model was recently proposed to describe some realistic physical signal propagation phenomena, where a Rician faded signal is impacted by cascaded shadowing processes. In this letter, we study the outage performance of the double shadowed Rician model. More specifically, we investigate the impact of two different shadowing processes on the secrecy performance by deriving novel and exact expressions for secrecy outage performance metrics. The obtained results reveal the following physical implications: 1) when a Rician faded signal undergoes line-of-sight (LoS) shadowing, which is futher cascaded by another round of composite shadowing, the latter form of shadowing imposes larger impact on the secrecy performance; 2) the widely investigated concept of "protected zone" to improve the secrecy performance should not be limited to the legitimate transmitter but also extended to the legitimate receiver due to the adverse shadowing effect cased by objects in its vicinity; and 3) the rate of outage performance degradation grows larger as the shadowings become severer. | nb_NO |
dc.description.abstract | Secrecy outage analysis of double shadowed Rician channels | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Institution of Engineering and Technology (IET) | nb_NO |
dc.relation.uri | https://digital-library.theiet.org/docserver/fulltext/10.1049/el.2019.0707/EL.2019.0707.pdf?expires=1556627029&id=id&accname=477932&checksum=5B57E9CB31C0D78CEA9D271D51785D9C | |
dc.title | Secrecy outage analysis of double shadowed Rician channels | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.pagenumber | 2 | nb_NO |
dc.source.journal | Electronics Letters | nb_NO |
dc.identifier.doi | 10.1049/el.2019.0707 | |
dc.identifier.cristin | 1694790 | |
dc.description.localcode | This paper is a postprint of a paper submitted to and accepted for publication in Electronics Letters and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at the IET Digital Library | nb_NO |
cristin.unitcode | 194,64,94,0 | |
cristin.unitname | Institutt for vareproduksjon og byggteknikk | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 | |