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dc.contributor.authorAi, Yun
dc.contributor.authorKong, Long
dc.contributor.authorCheffena, Michael
dc.date.accessioned2019-05-02T05:54:19Z
dc.date.available2019-05-02T05:54:19Z
dc.date.created2019-04-30T14:08:58Z
dc.date.issued2019
dc.identifier.citationElectronics Letters. 2019, .nb_NO
dc.identifier.issn0013-5194
dc.identifier.urihttp://hdl.handle.net/11250/2596204
dc.description.abstractThe double shadowed Rician model was recently proposed to describe some realistic physical signal propagation phenomena, where a Rician faded signal is impacted by cascaded shadowing processes. In this letter, we study the outage performance of the double shadowed Rician model. More specifically, we investigate the impact of two different shadowing processes on the secrecy performance by deriving novel and exact expressions for secrecy outage performance metrics. The obtained results reveal the following physical implications: 1) when a Rician faded signal undergoes line-of-sight (LoS) shadowing, which is futher cascaded by another round of composite shadowing, the latter form of shadowing imposes larger impact on the secrecy performance; 2) the widely investigated concept of "protected zone" to improve the secrecy performance should not be limited to the legitimate transmitter but also extended to the legitimate receiver due to the adverse shadowing effect cased by objects in its vicinity; and 3) the rate of outage performance degradation grows larger as the shadowings become severer.nb_NO
dc.description.abstractSecrecy outage analysis of double shadowed Rician channelsnb_NO
dc.language.isoengnb_NO
dc.publisherInstitution of Engineering and Technology (IET) nb_NO
dc.relation.urihttps://digital-library.theiet.org/docserver/fulltext/10.1049/el.2019.0707/EL.2019.0707.pdf?expires=1556627029&id=id&accname=477932&checksum=5B57E9CB31C0D78CEA9D271D51785D9C
dc.titleSecrecy outage analysis of double shadowed Rician channelsnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber2nb_NO
dc.source.journalElectronics Lettersnb_NO
dc.identifier.doi10.1049/el.2019.0707
dc.identifier.cristin1694790
dc.description.localcodeThis paper is a postprint of a paper submitted to and accepted for publication in Electronics Letters and is subject to Institution of Engineering and Technology Copyright. The copy of record is available at the IET Digital Librarynb_NO
cristin.unitcode194,64,94,0
cristin.unitnameInstitutt for vareproduksjon og byggteknikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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