dc.contributor.author | Bolstad, Torstein | |
dc.contributor.author | Kjærnes, Kristoffer | |
dc.contributor.author | Raa, Kristoffer S. | |
dc.contributor.author | Takahashi, Ryota | |
dc.contributor.author | Lippmaa, Mikk | |
dc.contributor.author | Tybell, Per Thomas Martin | |
dc.date.accessioned | 2019-03-15T12:37:38Z | |
dc.date.available | 2019-03-15T12:37:38Z | |
dc.date.created | 2019-03-05T13:05:13Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | Materials Research Express. 2019, 6 056409-?. | nb_NO |
dc.identifier.issn | 2053-1591 | |
dc.identifier.uri | http://hdl.handle.net/11250/2590260 | |
dc.description.abstract | The synthesis of (111)-oriented BaTiO3 thin films on Nb-doped SrTiO3 and bilayers of BaTiO3 and La0.7Sr0.3MnO3 on SrTiO3 are investigated. With increasing thickness the films are found to exhibit a decreasing out-of-plane lattice parameter and increased surface roughness. The BaTiO3 films on doped SrTiO3 are found to be relaxed with indications of increasing defect density with increasing thickness. Through piezoresponse force microscopy, pyroelectric measurements, and tunneling electroresistance measurements, indications of ferroelectric behavior are found in (111)-oriented BaTiO3 down to a thickness of 5 nm. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | IOP Publishing | nb_NO |
dc.title | Synthesis and characterization of (111)-oriented BaTiO3 thin films | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.pagenumber | 056409-? | nb_NO |
dc.source.volume | 6 | nb_NO |
dc.source.journal | Materials Research Express | nb_NO |
dc.identifier.doi | https://doi.org/10.1088/2053-1591/ab0221 | |
dc.identifier.cristin | 1682372 | |
dc.relation.project | Norges forskningsråd: 221860 | nb_NO |
dc.relation.project | Norges forskningsråd: 231290 | nb_NO |
dc.relation.project | Norges forskningsråd: 245963 | nb_NO |
dc.description.localcode | © 2019 IOP Publishing Ltd. This is an author-created, un-copyedited version of an article accepted for publication/published in Materials Research Express. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/2053-1591/ab0221 | nb_NO |
cristin.unitcode | 194,63,35,0 | |
cristin.unitname | Institutt for elektroniske systemer | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 | |