dc.contributor.author | Liu, Xinwei | |
dc.contributor.author | Pedersen, Marius | |
dc.contributor.author | Charrier, Christophe | |
dc.contributor.author | Bours, Patrick | |
dc.date.accessioned | 2018-04-04T07:48:44Z | |
dc.date.available | 2018-04-04T07:48:44Z | |
dc.date.created | 2018-03-01T21:06:18Z | |
dc.date.issued | 2017 | |
dc.identifier.citation | Proceedings of IEEE international conference on image processing. 2017, 3530-3534. | nb_NO |
dc.identifier.issn | 1522-4880 | |
dc.identifier.uri | http://hdl.handle.net/11250/2492490 | |
dc.description.abstract | The overall performance of iris recognition systems is affected by the quality of acquired iris sample images. Due to the development of imaging technologies, visible wavelength iris recognition gained a lot of attention in the past few years. However, iris sample quality of unconstrained imaging conditions is a more challenging issue compared to the traditional near infrared iris biometrics. Therefore, measuring the quality of such iris images is essential in order to have good quality samples for iris recognition. In this paper, we investigate whether general purpose no-reference image quality metrics can assess visible wavelength iris sample quality. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | nb_NO |
dc.title | Can no-reference image quality metrics assess visible wavelength iris sample quality? | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | acceptedVersion | nb_NO |
dc.source.pagenumber | 3530-3534 | nb_NO |
dc.source.journal | Proceedings of IEEE international conference on image processing | nb_NO |
dc.identifier.doi | 10.1109/ICIP.2017.8296939 | |
dc.identifier.cristin | 1569931 | |
dc.relation.project | Norges forskningsråd: 221073 | nb_NO |
dc.description.localcode | © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | nb_NO |
cristin.unitcode | 194,63,10,0 | |
cristin.unitcode | 194,63,30,0 | |
cristin.unitname | Institutt for datateknologi og informatikk | |
cristin.unitname | Institutt for informasjonssikkerhet og kommunikasjonsteknologi | |
cristin.ispublished | true | |
cristin.fulltext | postprint | |
cristin.qualitycode | 1 | |