Blar i Institutt for elektroniske systemer på tidsskrift "Ultramicroscopy"
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Detecting minute amounts of nitrogen in GaNAs thin films using STEM and CBED
(Journal article; Peer reviewed, 2021)Nitrogen (N) is a common element added to GaAs for band gap engineering and strain compensation. However, detection of small amounts of N is difficult for electron microscopy as well as for other chemical analysis techniques. ...