Browsing Institutt for elektroniske systemer by Subject "ntnudaim:5424"
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Built-in Self-Test (BIST) for SRAM in Deep Sub-Micron
(Master thesis, 2010)This thesis is a study of the fault mechanisms in static random access memories (SRAMs) and an implementation of a built-in self-test (BIST) module for these memories. Special emphasis has been put on the state-of-the-art ...