Browsing Institutt for elektroniske systemer by Author "Manikandan, Palanichamy"
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Path Delay Fault Test and BIST
Manikandan, Palanichamy (Doktoravhandlinger ved NTNU, 1503-8181; 2013:170, Doctoral thesis, 2013)The advanced semiconductor manufacturing processes, integrated chip design methodology and high level integrated circuit (IC) packaging are constantly giving challenges to the test industry and demands an efficient circuit ...