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A Machine-Learning Architecture for Sensor Fault Detection, Isolation and Accommodation in Digital Twins

Darvishi, Hossein; Ciuonzo, Domenico; Salvo Rossi, Pierluigi
Journal article, Peer reviewed
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URI
https://hdl.handle.net/11250/3058906
Date
2022
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  • Institutt for elektroniske systemer [2487]
  • Publikasjoner fra CRIStin - NTNU [41872]
Original version
IEEE Sensors Journal. 2022, 23 (3), 2522-2538.   10.1109/JSEN.2022.3227713
Abstract
Sensor technologies empower Industry 4.0 by enabling integration of in-field and real-time raw data into digital twins. However, sensors might be unreliable due to inherent issues and/or environmental conditions. This paper aims at detecting anomalies instantaneously in measurements from sensors, identifying the faulty ones and accommodating them with appropriate estimated data, thus paving the way to reliable digital twins. More specifically, a real-time general machine-learning-based architecture for sensor validation is proposed, built upon a series of neural-network estimators and a classifier. Estimators correspond to virtual sensors of all unreliable sensors (to reconstruct normal behaviour and replace the isolated faulty sensor within the system), whereas the classifier is used for detection and isolation tasks. A comprehensive statistical analysis on three different real-world data-sets is conducted and the performance of the proposed architecture is validated under hard and soft synthetically-generated faults.
 
A Machine-Learning Architecture for Sensor Fault Detection, Isolation and Accommodation in Digital Twins
 
Publisher
IEEE
Journal
IEEE Sensors Journal
Copyright
© 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works

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