| dc.contributor.author | Deborah, Hilda | |
| dc.contributor.author | Richard, Noel | |
| dc.contributor.author | Hardeberg, Jon Yngve | |
| dc.date.accessioned | 2020-01-20T12:49:02Z | |
| dc.date.available | 2020-01-20T12:49:02Z | |
| dc.date.created | 2019-11-28T17:58:16Z | |
| dc.date.issued | 2019 | |
| dc.identifier.citation | Proceedings of SPIE, the International Society for Optical Engineering. 2019, 11172 . | nb_NO |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | http://hdl.handle.net/11250/2637025 | |
| dc.description.abstract | The development of a spectral difference-based statistical processing of hyperspectral images is provided in this article. Kullback-Leibler pseudo-divergence function, which was specifically developed for the metrological processing of hyperspectral images, is used at the foundation of the statistics. As a demonstration of its use, the proposed statistics are used in visualising surface variability within a set of pigment patches. It is then further exploited to detect anomalies and deterioration that occur on the patches. | nb_NO |
| dc.language.iso | eng | nb_NO |
| dc.publisher | Society of Photo-optical Instrumentation Engineers (SPIE) | nb_NO |
| dc.title | Application of spectral statistics to surface defect detection | nb_NO |
| dc.type | Journal article | nb_NO |
| dc.type | Peer reviewed | nb_NO |
| dc.description.version | publishedVersion | nb_NO |
| dc.source.pagenumber | 8 | nb_NO |
| dc.source.volume | 11172 | nb_NO |
| dc.source.journal | Proceedings of SPIE, the International Society for Optical Engineering | nb_NO |
| dc.identifier.doi | 10.1117/12.2521714 | |
| dc.identifier.cristin | 1754093 | |
| dc.description.localcode | © 2019 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | nb_NO |
| cristin.unitcode | 194,63,10,0 | |
| cristin.unitname | Institutt for datateknologi og informatikk | |
| cristin.ispublished | true | |
| cristin.fulltext | original | |
| cristin.qualitycode | 1 | |
