Application of spectral statistics to surface defect detection
Journal article, Peer reviewed
Published version
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http://hdl.handle.net/11250/2637025Utgivelsesdato
2019Metadata
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Originalversjon
Proceedings of SPIE, the International Society for Optical Engineering. 2019, 11172 . 10.1117/12.2521714Sammendrag
The development of a spectral difference-based statistical processing of hyperspectral images is provided in this article. Kullback-Leibler pseudo-divergence function, which was specifically developed for the metrological processing of hyperspectral images, is used at the foundation of the statistics. As a demonstration of its use, the proposed statistics are used in visualising surface variability within a set of pigment patches. It is then further exploited to detect anomalies and deterioration that occur on the patches.