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dc.contributor.authorWu, Ouyang
dc.contributor.authorBouaswaig, Ala
dc.contributor.authorImsland, Lars Struen
dc.contributor.authorSchneider, Stefan
dc.contributor.authorRoth, Matthias
dc.contributor.authorMoreno Leira, Fernando
dc.date.accessioned2019-12-02T15:22:26Z
dc.date.available2019-12-02T15:22:26Z
dc.date.created2019-09-17T16:19:39Z
dc.date.issued2019
dc.identifier.citationComputers and Chemical Engineering. 2019, 128 117-127.nb_NO
dc.identifier.issn0098-1354
dc.identifier.urihttp://hdl.handle.net/11250/2631320
dc.description.abstractIn the process industry, various types of degradation occur in processing plants, resulting in significant economic losses. Modeling of degradation is important because it provides quantitative insights for consideration of degradation impacts in the operations of process manufacturing. This paper studies batch processes that show a periodic pattern for the evolution of degradation. A new data structure, the campaign, is applied for data-driven modeling of the periodic batch-to-batch evolution of degradation using a new multiway partial least squares approach, and it is further employed to predict the evolution of degradation in a series of batch runs. The proposed approach is illustrated and applied in a comprehensive industrial case study. The example illustrates the efficacy of the proposed model and presents a fair potential for applications of degradation prediction.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleCampaign-based modeling for degradation evolution in batch processes using a multiway partial least squares approachnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber117-127nb_NO
dc.source.volume128nb_NO
dc.source.journalComputers and Chemical Engineeringnb_NO
dc.identifier.doi10.1016/j.compchemeng.2019.05.038
dc.identifier.cristin1725835
dc.description.localcode© 2019 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license. (http://creativecommons.org/licenses/by-nc-nd/4.0/)nb_NO
cristin.unitcode194,63,25,0
cristin.unitnameInstitutt for teknisk kybernetikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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