| dc.contributor.author | Ghazali, Aina | |
| dc.contributor.author | Bugge, Audun Nystad | |
| dc.contributor.author | Sauge, Sebastien | |
| dc.contributor.author | Makarov, Vadim | |
| dc.date.accessioned | 2019-10-11T08:42:33Z | |
| dc.date.available | 2019-10-11T08:42:33Z | |
| dc.date.created | 2012-01-04T23:32:45Z | |
| dc.date.issued | 2011 | |
| dc.identifier.citation | IIUM Engineering Journal. 2011, 12 (5), 97-104. | nb_NO |
| dc.identifier.issn | 1511-788X | |
| dc.identifier.uri | http://hdl.handle.net/11250/2621513 | |
| dc.description.abstract | We report an automated characterization of a single-photon detector based on commercial silicon avalanche photodiode (PerkinElmer C30902SH). The photodiode is characterized by I-V curves at different illumination levels (darkness, 10 pW and 10 µW), dark count rate and photon detection efficiency at different bias voltages. The automated characterization routine is implemented in C++ running on a Linux computer. | nb_NO |
| dc.language.iso | eng | nb_NO |
| dc.publisher | IIUM Press, International Islamic University Malaysia | nb_NO |
| dc.relation.uri | http://www.iium.edu.my/ejournal/index.php/iiumej/article/view/243 | |
| dc.title | Automated characterization of single-photon avalanche photodiode | nb_NO |
| dc.type | Journal article | nb_NO |
| dc.type | Peer reviewed | nb_NO |
| dc.description.version | publishedVersion | nb_NO |
| dc.source.pagenumber | 97-104 | nb_NO |
| dc.source.volume | 12 | nb_NO |
| dc.source.journal | IIUM Engineering Journal | nb_NO |
| dc.source.issue | 5 | nb_NO |
| dc.identifier.cristin | 877014 | |
| dc.description.localcode | Open Access | nb_NO |
| cristin.unitcode | 194,63,35,0 | |
| cristin.unitname | Institutt for elektroniske systemer | |
| cristin.ispublished | true | |
| cristin.fulltext | original | |
| cristin.qualitycode | 1 | |
