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dc.contributor.authorFalch, Ken Vidar
dc.contributor.authorDetlefs, Carsten
dc.contributor.authorChristensen, Magnus Sebastian
dc.contributor.authorPaganin, David
dc.contributor.authorMathiesen, Ragnvald
dc.date.accessioned2019-09-26T07:35:27Z
dc.date.available2019-09-26T07:35:27Z
dc.date.created2019-08-07T11:52:14Z
dc.date.issued2019
dc.identifier.citationOptics Express. 2019, 27 (15), 20311-20322.nb_NO
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/11250/2618856
dc.description.abstractThe beam diffusing properties of stacked layers of diffuser material were evaluated experimentally and compared to a Gaussian random phase screen model. The model was found to give promising accuracy in combination with a Lorentzian auto-correlation model. The tail behaviour of the angular scattering distribution as a function of number of diffusing layers was particularly well described by the model, and in the case of an amorphous carbon diffuser, the model could describe the whole of the scattering distribution convincingly.nb_NO
dc.language.isoengnb_NO
dc.publisherOptical Society of Americanb_NO
dc.titleExperimental investigation of Gaussian random phase screen model for x-ray diffusersnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber20311-20322nb_NO
dc.source.volume27nb_NO
dc.source.journalOptics Expressnb_NO
dc.source.issue15nb_NO
dc.identifier.doi10.1364/OE.27.020311
dc.identifier.cristin1714559
dc.description.localcode© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreementnb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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