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dc.contributor.authorHansen, Svein Arne Jervell
dc.contributor.authorAkram, Muhammad Nadeem
dc.contributor.authorHardeberg, Jon Yngve
dc.contributor.authorPedersen, Marius
dc.date.accessioned2019-03-22T13:07:30Z
dc.date.available2019-03-22T13:07:30Z
dc.date.created2018-07-02T11:19:58Z
dc.date.issued2018
dc.identifier.issn1017-9909
dc.identifier.urihttp://hdl.handle.net/11250/2591341
dc.description.abstractShifted superimposition is a resolution-enhancement method that has gained popularity in the projector industry the last couple of years. This method consists of shifting every other projected frame spatially with subpixel precision, and by doing so creating a new pixel grid on the projected surface with smaller effective pixel pitch. There is still an open question of how well this technique performs in comparison with the native resolution, and how high the effective resolution gain really is. To help investigate these questions, we have developed a framework for simulating different superimposition methods over different image contents, and evaluate the result using several image quality metrics (IQMs). We have also performed a subjective experiment with observers who rate the simulated image content, and calculated the correlation between the subjective results and the IQMs. We found that the visual information fidelity metric is the most suitable to evaluate natural superimposed images when subjective match is desired. However, this metric does not detect the distortion in synthetic images. The multiscale structural similarity metric which is based on the analysis of image structure is better at detecting this distortion.nb_NO
dc.language.isoengnb_NO
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)nb_NO
dc.titlePreferred image quality metric for shifted superimposition-based resolution-enhanced imagesnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.volume27:033017nb_NO
dc.source.journalJournal of Electronic Imaging (JEI)nb_NO
dc.source.issue3nb_NO
dc.identifier.doi10.1117/1.JEI.27.3.033017
dc.identifier.cristin1595116
dc.description.localcodeCopyright 2018. Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.nb_NO
cristin.unitcode194,63,10,0
cristin.unitnameInstitutt for datateknologi og informatikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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