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dc.contributor.authorCastberg, Rene
dc.contributor.authorRozynek, Zbigniew
dc.contributor.authorFossum, Jon Otto
dc.contributor.authorMåløy, Knut Jørgen
dc.contributor.authorDommersnes, Paul
dc.contributor.authorFlekkøy, Eirik Grude
dc.date.accessioned2017-11-02T11:52:25Z
dc.date.available2017-11-02T11:52:25Z
dc.date.created2013-01-20T22:33:02Z
dc.date.issued2012
dc.identifier.citationRevista Cubana de Física. 2012, 29 (1E), 17-19.nb_NO
dc.identifier.issn0253-9268
dc.identifier.urihttp://hdl.handle.net/11250/2463685
dc.description.abstractThe response of rotational alignment of lithium fluorohectorite (Li-Fh) to an external electric field has been studied by employing image analysis. Large aggregates consisting of many single clay particles were prepared using a sedimentation technique in order to control both their shapes and sizes. Such aggregates have a layered structure which was confirmed by wide-angle X-ray scattering (WAXS) studies. Measuring the electric-fieldinduced alignment of these particles we obtained a data collapse by plotting ln(i) versus t/E2 , where i is the rotational angle, t is time and E is the electric field strength.nb_NO
dc.language.isoengnb_NO
dc.publisherSociedad Cubana de Físicanb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleClay alignment in electric fieldsnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber17-19nb_NO
dc.source.volume29nb_NO
dc.source.journalRevista Cubana de Físicanb_NO
dc.source.issue1Enb_NO
dc.identifier.cristin993670
dc.relation.projectNorges forskningsråd: 200041nb_NO
dc.description.localcodeCopyright © 2012 The Author(s). This is an open access article distributed under the Creative Commons Attribution License, CC BY 3.0 (https://creativecommons.org/licenses/by/3.0/)nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal