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Topography and force imaging in atomic force microscopy by state and parameter estimation

Ragazzon, Michael Remo Palmén; Gravdahl, Jan Tommy; Pettersen, Kristin Ytterstad; Eielsen, Arnfinn Aas
Journal article, Peer reviewed
Accepted version
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URI
http://hdl.handle.net/11250/2463669
Date
2015
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  • Institutt for teknisk kybernetikk [2251]
  • Publikasjoner fra CRIStin - NTNU [21000]
Original version
American Control Conference (ACC). 2015, 2015-July 3496-3502.   10.1109/ACC.2015.7171872
Abstract
A novel imaging method for atomic force microscopy based on estimation of state and parameters is presented. The cantilever dynamics is modeled as a linear system augmented by the tip-sample interaction force. The states of this augmented system are observed. The tip-sample force function is based on the Lennard-Jones potential with a nonlinearly parameterized unknown topography parameter. By estimating this parameter together with the tip-sample force using a nonlinear observer approach, the topography of the sample can be found. The observer and parameter estimator is shown to be exponentially stable. Simulation results are presented and compared to a more conventional extended Kalman filter.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Journal
American Control Conference (ACC)

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