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dc.contributor.authorCuypers, Hans
dc.contributor.authorFleischmann, Yael
dc.date.accessioned2024-09-02T08:38:34Z
dc.date.available2024-09-02T08:38:34Z
dc.date.created2023-10-09T09:38:18Z
dc.date.issued2023
dc.identifier.citationInnovations in Incidence Geometry - Algebraic, Topological, Combinatorial. 2023, 20 (2-3), 223-245.en_US
dc.identifier.issn2640-7345
dc.identifier.urihttps://hdl.handle.net/11250/3149571
dc.language.isoengen_US
dc.publisherMathematical Sciences Publishersen_US
dc.titleA geometric characterization of the symplectic Lie algebraen_US
dc.title.alternativeA geometric characterization of the symplectic Lie algebraen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holderThis version will not be available due to the publisher's copyright.en_US
dc.source.pagenumber223-245en_US
dc.source.volume20en_US
dc.source.journalInnovations in Incidence Geometry - Algebraic, Topological, Combinatorialen_US
dc.source.issue2-3en_US
dc.identifier.doi10.2140/iig.2023.20.223
dc.identifier.cristin2182749
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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