dc.contributor.author | Ubostad, Tobias Nieckula | |
dc.contributor.author | Peftitsis, Dimosthenis | |
dc.date.accessioned | 2024-06-24T12:28:28Z | |
dc.date.available | 2024-06-24T12:28:28Z | |
dc.date.created | 2024-06-21T12:49:34Z | |
dc.date.issued | 2024 | |
dc.identifier.isbn | 978-3-8007-6288-0 | |
dc.identifier.uri | https://hdl.handle.net/11250/3135605 | |
dc.description.abstract | Series connection of Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) is a viable solution to design switches for voltages that are not yet commercially available or limited for single-die devices. However, the stray inductance in the current commutation loop is larger than a single high-voltage (HV) device, due to the electrical connections of the series-connected SiC MOSFETs. Thus, instead of serializing several discrete packaged devices or power modules, which introduce significant stray inductance, this paper introduces the design of a power module with die-level series-connected SiC MOSFETs. In order to demonstrate the feasibility of this approach, a direct bond copper (DBC) layout accommodating two series-connected 1.2 kV SiC MOSFET dies to form a 2.4 kV switch has been designed. Moreover, decoupling capacitors are integrated inside the module to mitigate high-frequency current and voltage oscillations. Characterization of the power module’s inductive layout is presented in terms of FEM simulations and measurements. Finally, the switching performance of the series-connected dies is presented experimentally at a blocking voltage of 1 kV. | en_US |
dc.description.abstract | Die-Level Series-Connection of SiC MOSFETs and Integration of Decoupling Capacitors | en_US |
dc.language.iso | eng | en_US |
dc.publisher | VDE Verlag | en_US |
dc.relation.ispartof | CIPS 2024; 13th International Conference on Integrated Power Electronics Systems | |
dc.relation.uri | https://ieeexplore.ieee.org/document/10564771 | |
dc.title | Die-Level Series-Connection of SiC MOSFETs and Integration of Decoupling Capacitors | en_US |
dc.title.alternative | Die-Level Series-Connection of SiC MOSFETs and Integration of Decoupling Capacitors | en_US |
dc.type | Chapter | en_US |
dc.description.version | publishedVersion | en_US |
dc.rights.holder | This version of the article is not available due to the publisher copyright restrictions. | en_US |
dc.source.pagenumber | 346-352 | en_US |
dc.identifier.cristin | 2277985 | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |