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dc.contributor.authorLi, Ningyang
dc.contributor.authorWang, Zhaohui
dc.contributor.authorAlaya Cheikh, Faouzi
dc.contributor.authorUllah, Mohib
dc.date.accessioned2024-01-16T13:33:35Z
dc.date.available2024-01-16T13:33:35Z
dc.date.created2023-12-18T09:33:26Z
dc.date.issued2023
dc.identifier.citationIEEE Access. 2023, 11 128667-128680.en_US
dc.identifier.issn2169-3536
dc.identifier.urihttps://hdl.handle.net/11250/3111881
dc.description.abstractSpectral-spatial classification of hyperspectral image (HSI) has made enormous achievements in many applications. One of the critical attributes that affects classification accuracy is the width of HSI cube/patch. To seek the optimal sample width, most researches enumerate all possible widths and verify them with the corresponding widths of HSI cubes in turn, which will require model to be particular for each width and consume plenty of time and computing power. In this article, the influential factors of the optimal sample width are studied from the perspectives of model architecture and data set for spectral-spatial classification of HSI. Specifically, to investigate the influence factors from model architecture, diverse numbers of filters and kernel sizes are applied in models for classification. The potential influence factors from data set are reflected mainly in the spatial distribution of land-cover, which can be described with short, long, and average edges. Moreover, according to the number of samples, five kinds of spatial distributions from the fewest category, fewer categories, larger categories, the largest category, and whole data set are considered. To explore the relationships between them and the optimal sample width, samples from the corresponding categories are expanded via a centralized spectral-spatial sample expansion method for classification. Experimental results show that the most possible influence factor of the optimal sample width primarily focuses on the neutral short edge of whole data set.en_US
dc.language.isoengen_US
dc.publisherIEEE, Institute of Electrical and Electronics Engineersen_US
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleAn Exploration on the Influence Factors of the Optimal Sample Width for Hyperspectral Remote Sensing Image Classificationen_US
dc.title.alternativeAn Exploration on the Influence Factors of the Optimal Sample Width for Hyperspectral Remote Sensing Image Classificationen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber128667-128680en_US
dc.source.volume11en_US
dc.source.journalIEEE Accessen_US
dc.identifier.doi10.1109/ACCESS.2023.3332695
dc.identifier.cristin2214649
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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