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dc.contributor.authorUbostad, Tobias Nieckula
dc.contributor.authorPeftitsis, Dimosthenis
dc.date.accessioned2023-08-14T10:49:00Z
dc.date.available2023-08-14T10:49:00Z
dc.date.created2023-06-02T11:13:38Z
dc.date.issued2023
dc.identifier.isbn978-1-6654-7539-6
dc.identifier.urihttps://hdl.handle.net/11250/3083777
dc.description.abstractSeries connection of Silicon Carbide (SiC) metal-oxide semiconductor field-effect transistors (MOSFETs) is an interesting solution to design switches for voltages that are not yet commercially available or limited for single-die devices. However, inherent static and dynamic voltage balancing issues in a serialized stack need to be addressed. Most of the balancing techniques shown in literature are based on active snubber and adaptive driver circuits requiring complex circuitry, with high component counts, complex control schemes and high-speed voltage and current sensors. Moreover, such circuits are difficult to tune for optimal operation, especially for adaptive operation under load variations. The RC snubber, on the other hand, is a simple circuit, with low component count. The aim of this paper is to investigate the design and tuning limits of RC snubber circuits and non-adaptive, standard, voltage-source gate drivers for achieving the best-balancing transient and steady-state voltage distributions among series-connected discrete SiC MOSFETs operating at speeds higher than 100 kV/µs. Furthermore, the effect of device parameters spread has been studied. It has been shown that a larger parameter mismatch will lead uneven switching energy losses. However, the anticipated voltage balance and increased switching losses are still within an acceptable range.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartof2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
dc.relation.urihttps://ieeexplore.ieee.org/document/10131240
dc.titleDesign Considerations for Series-Connected SiC MOSFETs Operating at 100 kV/µsen_US
dc.title.alternativeDesign Considerations for Series-Connected SiC MOSFETs Operating at 100 kV/µsen_US
dc.typeChapteren_US
dc.description.versionpublishedVersionen_US
dc.rights.holderThis version will not be available due to the publisher's copyright.en_US
dc.source.pagenumber217-224en_US
dc.identifier.doi10.1109/APEC43580.2023.10131240
dc.identifier.cristin2151136
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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