dc.contributor.author | Darvishi, Hossein | |
dc.contributor.author | Ciuonzo, Domenico | |
dc.contributor.author | Salvo Rossi, Pierluigi | |
dc.date.accessioned | 2023-03-13T09:50:31Z | |
dc.date.available | 2023-03-13T09:50:31Z | |
dc.date.created | 2022-09-03T11:11:55Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1930-0395 | |
dc.identifier.uri | https://hdl.handle.net/11250/3057897 | |
dc.description.abstract | Decision-support systems rely on data exchange between digital twins (DTs) and physical twins (PTs). Faulty sensors (e.g, due to hardware/software failures) deliver unreliable data and potentially generate critical damages. Prompt sensor fault detection, isolation and accommodation (SFDIA) plays a crucial role in DT design. In this respect, data-driven approaches to SFDIA have recently shown to be effective. This work focuses on a modular SFDIA (M-SFDIA) architecture and explores the impact of using different types of neural-network (NN) building blocks. Numerical results of different choices are shown with reference to a wireless sensor network publicly-available dataset demonstrating the validity of such architecture. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | IEEE, Institute of Electrical and Electronics Engineers | en_US |
dc.title | Exploring a Modular Architecture for Sensor Validation in Digital Twins | en_US |
dc.title.alternative | Exploring a Modular Architecture for Sensor Validation in Digital Twins | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Journal article | en_US |
dc.description.version | acceptedVersion | en_US |
dc.rights.holder | © IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
dc.source.volume | 2022 | en_US |
dc.source.journal | Proceedings of IEEE Sensors: conference | en_US |
dc.identifier.doi | 10.1109/SENSORS52175.2022.9967175 | |
dc.identifier.cristin | 2048530 | |
dc.relation.project | Norges forskningsråd: 311902 | en_US |
cristin.ispublished | true | |
cristin.fulltext | preprint | |
cristin.qualitycode | 1 | |