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dc.contributor.authorKonstantinou, Konstantinos
dc.contributor.authorMocanu, Felix C.
dc.contributor.authorAkola, Jaakko
dc.date.accessioned2023-02-02T09:29:34Z
dc.date.available2023-02-02T09:29:34Z
dc.date.created2022-11-28T09:44:24Z
dc.date.issued2022
dc.identifier.citationPhysical review B (PRB). 2022, 106 (18), .en_US
dc.identifier.issn2469-9950
dc.identifier.urihttps://hdl.handle.net/11250/3047919
dc.description.abstractUnderstanding the relation between the structural disorder in the atomic geometry of the recrystallized state of phase-change memory materials and the localized states in the electronic structure is necessary not only for technological advances, but also essential to achieve a fundamental understanding of these materials. In this computational study, hybrid density-functional theory simulations are employed to ascertain the impact of antisite defects on the spatial localization of the electronic states in the bottom of the conduction band in recrystallized models of the prototypical phase-change material Ge2Sb2Te5. Te−Te homopolar bonds are the local defective atomic environments mainly responsible for the electron localization of the conduction-band-edge states in the simulated structures, while Sb−Te chains can also induce spatial localization. Unoccupied defect-related electronic states can emerge in the band gap during a crystallization event, while Sb−Sb homopolar bonds have been identified in the defect environment of a deep localized state.en_US
dc.language.isoengen_US
dc.publisherAmerican Physical Societyen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleElectron localization in recrystallized models of the Ge2Sb2Te5 phase-change memory materialen_US
dc.title.alternativeElectron localization in recrystallized models of the Ge2Sb2Te5 phase-change memory materialen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.pagenumber0en_US
dc.source.volume106en_US
dc.source.journalPhysical review B (PRB)en_US
dc.source.issue18en_US
dc.identifier.doi10.1103/PhysRevB.106.184103
dc.identifier.cristin2082106
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode2


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