Show simple item record

dc.contributor.authorFeet, Odd Christian
dc.contributor.authorSeeger, Martin
dc.contributor.authorOver, Daniel
dc.contributor.authorNiayesh, Kaveh
dc.contributor.authorMauseth, Frank
dc.date.accessioned2022-05-05T14:21:56Z
dc.date.available2022-05-05T14:21:56Z
dc.date.created2020-08-28T08:36:00Z
dc.date.issued2020
dc.identifier.issn1996-1073
dc.identifier.urihttps://hdl.handle.net/11250/2994412
dc.description.abstractThe electric breakdown at single and multiple protrusions in SF6 and CO2 is investigated at 0.4 and 0.6 MPa, respectively. Additionally, the breakdown fields at rough surfaces of two different areas were determined. From the measurements, breakdown probability distributions for single protrusions were determined and fitted by Weibull distributions. This allowed the determination of statistical enlargement laws for the 50% breakdown probability fields E50. Such enlargement laws describe, for example, the scaling of breakdown field with electrode area or number of protrusions. The predictions were compared to the experimental data, and both agreement and discrepancies were observed depending on polarity and number of protrusions and gas. Discharge predictions including first electron, streamer inception and crossing, as well as leader propagation, gave further insight to this. It was found that predictions from enlargement laws based on statistical processes may not describe the measured breakdown fields well and that relevant physical breakdown criteria must also be considered.en_US
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.relation.urihttps://www.mdpi.com/1996-1073/13/17/4449
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleBreakdown at Multiple Protrusions in SF6 and CO2en_US
dc.title.alternativeBreakdown at Multiple Protrusions in SF6 and CO2en_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.volume13en_US
dc.source.journalEnergiesen_US
dc.source.issue17en_US
dc.identifier.doi10.3390/en13174449
dc.identifier.cristin1825650
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record

Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal