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dc.contributor.authorSharma, Krishna Kumar
dc.contributor.authorSeal, Ayan
dc.contributor.authorYazidi, Anis
dc.contributor.authorSelamat, Ali
dc.contributor.authorKrejcar, Ondrej
dc.date.accessioned2022-04-26T06:41:09Z
dc.date.available2022-04-26T06:41:09Z
dc.date.created2021-08-10T15:25:17Z
dc.date.issued2021
dc.identifier.citationIEEE Access. 2021, 9 79505-79519.en_US
dc.identifier.issn2169-3536
dc.identifier.urihttps://hdl.handle.net/11250/2992652
dc.description.abstractIn recent years, uncertain data clustering has become the subject of active research in many fields, for example, pattern recognition, and machine learning. Nowadays, researchers have committed themselves to substitute the traditional distance or similarity measures with new metrics in the existing centralized clustering algorithms in order to tackle uncertainty in data. However, in order to perform uncertain data clustering, representation plays an imperative role. In this paper, a Monte-Carlo integration is adopted and modified to express uncertain data in a probabilistic form. Then three similarity measures are used to determine the closeness between two probability distributions including one novel measure. These similarity measures are derived from the notion of Kullback-Leibler divergence and Jeffreys divergence. Finally, density-based spatial clustering of applications with noise and k-medoids algorithms are modified and implemented on one synthetic database and three real-world uncertain databases. The obtained outcomes confirm that the proposed clustering technique defeats some of the existing algorithms.en_US
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleClustering Uncertain Data Objects Using Jeffreys-Divergence and Maximum Bipartite Matching Based Similarity Measureen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber79505-79519en_US
dc.source.volume9en_US
dc.source.journalIEEE Accessen_US
dc.identifier.doi10.1109/ACCESS.2021.3083969
dc.identifier.cristin1925150
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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