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dc.contributor.authorBONNET-BEN DHIA, Anne-Sophie
dc.contributor.authorChandler-Wilde, Simon
dc.contributor.authorFliss, Sonia
dc.contributor.authorHazard, Christophe
dc.contributor.authorPerfekt, Karl-Mikael
dc.contributor.authorTJANDRAWIDJAJA, Yohanes
dc.date.accessioned2022-04-20T08:09:46Z
dc.date.available2022-04-20T08:09:46Z
dc.date.created2022-02-02T10:08:10Z
dc.date.issued2022
dc.identifier.issn0036-1410
dc.identifier.urihttps://hdl.handle.net/11250/2991515
dc.description.abstractThe half-space matching (HSM) method has recently been developed as a new method for the solution of two-dimensional scattering problems with complex backgrounds, providing an alternative to perfectly matched layers or other artificial boundary conditions. Based on half-plane representations for the solution, the scattering problem is rewritten as a system of integral equations in which the unknowns are restrictions of the solution to the boundaries of a finite number of overlapping half-planes contained in the domain: this integral equation system is coupled to a standard finite element discretization localized around the scatterer. While satisfactory numerical results have been obtained for real wavenumbers, well-posedness and equivalence to the original scattering problem have been established only for complex wavenumbers. In the present paper, by combining the HSM framework with a complex-scaling technique, we provide a new formulation for real wavenumbers which is provably well-posed and has the attraction for computation that the complex-scaled solutions of the integral equation system decay exponentially at infinity. The analysis requires the study of double-layer potential integral operators on intersecting infinite lines, and their analytic continuations. The effectiveness of the method is validated by preliminary numerical results.en_US
dc.language.isoengen_US
dc.publisherSociety for Industrial and Applied Mathematicsen_US
dc.titleThe Complex-Scaled Half-Space Matching Methoden_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.rights.holderThis is the authors' accepted manuscript to an article published by Society for Industrial and Applied Mathematics.en_US
dc.subject.nsiVDP::Anvendt matematikk: 413en_US
dc.subject.nsiVDP::Applied mathematics: 413en_US
dc.source.journalSIAM Journal on Mathematical Analysisen_US
dc.identifier.doi10.1137/20M1387122
dc.identifier.cristin1996819
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode2


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