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dc.contributor.authorPhilipps, Daniel Alexander
dc.contributor.authorPeftitsis, Dimosthenis
dc.date.accessioned2022-04-04T12:46:04Z
dc.date.available2022-04-04T12:46:04Z
dc.date.created2022-01-14T11:12:49Z
dc.date.issued2021
dc.identifier.isbn978-1-6654-0182-1
dc.identifier.urihttps://hdl.handle.net/11250/2989665
dc.description.abstractFor efficient converter design, modeling of switching components must be both accurate and fast. A variety of simulation models for SiC Power MOSFETs has been developed. To achieve adequate accuracy, models are adjusted to experimental data by applying fitting methods. However, proposed universal fitting methods result in high-dimensional optimization problems. Their computational inefficiency leads to either long run times or low accuracy. This paper proposes a new universal parameter fitting method that is at least twice as fast and yields a more accurate outcome than presented methods under comparable conditions. It effectively reduces the dimensionality of the parameter fitting optimization problem by sensitivity-based reduction of optimization parameters. Thereby, it optimizes both model adjustment speed and accuracy, which are critical factors for an efficient converter design process. The method does not compromise flexibility as it is universally applicable to any SPICE model and can meet any model architecture preference.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.ispartof8th IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA)
dc.titleSmart Universal Parameter Fitting Method for Modeling Static SiC Power MOSFET Behavioren_US
dc.typeChapteren_US
dc.description.versionacceptedVersionen_US
dc.rights.holder© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other worksen_US
dc.identifier.doi10.1109/WiPDA49284.2021.9645144
dc.identifier.cristin1981057
dc.relation.projectNorges forskningsråd: 287820en_US
cristin.ispublishedtrue
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