dc.contributor.author | Helvoort, Antonius T. J. van | |
dc.contributor.author | Mosberg, Aleksander B. | |
dc.contributor.author | Ludacka, Ursula | |
dc.contributor.author | Holstad, Theodor Secanell | |
dc.contributor.author | Evans, Donald M. | |
dc.contributor.author | Meier, Dennis Gerhard | |
dc.date.accessioned | 2022-03-25T13:00:54Z | |
dc.date.available | 2022-03-25T13:00:54Z | |
dc.date.created | 2022-01-04T15:25:02Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1431-9276 | |
dc.identifier.uri | https://hdl.handle.net/11250/2987670 | |
dc.language.iso | eng | en_US |
dc.publisher | Cambridge University Press | en_US |
dc.title | STEM-based analysis of functional defects in ferroelectric ErMnO3 | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Journal article | en_US |
dc.description.version | publishedVersion | en_US |
dc.rights.holder | This version of the article will not be available due to copyright restrictions by Cambridge University Press | en_US |
dc.source.journal | Microscopy and Microanalysis | en_US |
dc.identifier.doi | 10.1017/S1431927621004475 | |
dc.identifier.cristin | 1974570 | |
dc.relation.project | Norges forskningsråd: 245963 | en_US |
dc.relation.project | Norges forskningsråd: 197405 | en_US |
dc.relation.project | Norges teknisk-naturvitenskapelige universitet: Enabling technologies: Nanotechnology | en_US |
dc.relation.project | Norges teknisk-naturvitenskapelige universitet: Onsager Fellowship Programme | en_US |
dc.relation.project | Norges teknisk-naturvitenskapelige universitet: NTNU Stjerneprogrammet | en_US |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |