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dc.contributor.authorHelvoort, Antonius T. J. van
dc.contributor.authorMosberg, Aleksander B.
dc.contributor.authorLudacka, Ursula
dc.contributor.authorHolstad, Theodor Secanell
dc.contributor.authorEvans, Donald M.
dc.contributor.authorMeier, Dennis Gerhard
dc.date.accessioned2022-03-25T13:00:54Z
dc.date.available2022-03-25T13:00:54Z
dc.date.created2022-01-04T15:25:02Z
dc.date.issued2021
dc.identifier.issn1431-9276
dc.identifier.urihttps://hdl.handle.net/11250/2987670
dc.language.isoengen_US
dc.publisherCambridge University Pressen_US
dc.titleSTEM-based analysis of functional defects in ferroelectric ErMnO3en_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holderThis version of the article will not be available due to copyright restrictions by Cambridge University Pressen_US
dc.source.journalMicroscopy and Microanalysisen_US
dc.identifier.doi10.1017/S1431927621004475
dc.identifier.cristin1974570
dc.relation.projectNorges forskningsråd: 245963en_US
dc.relation.projectNorges forskningsråd: 197405en_US
dc.relation.projectNorges teknisk-naturvitenskapelige universitet: Enabling technologies: Nanotechnologyen_US
dc.relation.projectNorges teknisk-naturvitenskapelige universitet: Onsager Fellowship Programmeen_US
dc.relation.projectNorges teknisk-naturvitenskapelige universitet: NTNU Stjerneprogrammeten_US
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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