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dc.contributor.authorGiannakis, Andreas
dc.contributor.authorPeftitsis, Dimosthenis
dc.date.accessioned2021-09-23T06:54:44Z
dc.date.available2021-09-23T06:54:44Z
dc.date.created2021-06-02T17:57:32Z
dc.date.issued2021
dc.identifier.citationIET Power Electronics. 2021, .en_US
dc.identifier.issn1755-4535
dc.identifier.urihttps://hdl.handle.net/11250/2780625
dc.description.abstractNormally-ON silicon carbide junction-field-effect transistors have a simple design and exhibit advantageous performance in terms of losses, elevated junction temperatures and high switching frequencies. However, under a loss of power to their gate, normally-ON junction-field-effect transistors are subject to a shoot-through situation, which might be severe for their survivability. This paper presents a universal concept for an automatic and self-powered gate driver power supply circuit for normally-ON silicon carbide junction- field-effect transistors employed in high input-impedance circuits. The power to the gate is supplied during start-up and steady-state operations through a mutually coupled induc- tor with the high input impedance inductor and by employing a typical low-voltage, power supply circuit. The performance of the proposed automatic and self-powered gate driver was evaluated on a DC/DC boost converter rated at 6 kW, as well as in a low-voltage solid- state DC circuit breaker. From experiments it is shown that using the proposed circuit, the start-up process requires approximately 350 s, while the steady-state switching process of the junction-field-effect transistor during steady-state is also shown. Using the proposed circuit in a low-voltage solid-state DC breaker, a fault current of 68 A is cleared within 155 s.en_US
dc.language.isoengen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleA universal automatic and self-powered gate driver power supply for normally-ON SiC JFETsen_US
dc.typeJournal articleen_US
dc.typePeer revieweden_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber14en_US
dc.source.journalIET Power Electronicsen_US
dc.identifier.doi10.1049/pel2.12151
dc.identifier.cristin1913391
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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