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dc.contributor.authorZhang, Zuo-Wei
dc.contributor.authorLiu, Zhe
dc.contributor.authorMa, Zongfang
dc.contributor.authorZhang, Yiru
dc.contributor.authorWang, Hao
dc.date.accessioned2021-02-22T15:23:27Z
dc.date.available2021-02-22T15:23:27Z
dc.date.created2021-01-08T15:40:05Z
dc.date.issued2021
dc.identifier.issn1041-4347
dc.identifier.urihttps://hdl.handle.net/11250/2729592
dc.description.abstractThe clustering of incomplete patterns is a very challenging task because the estimations may negatively affect the distribution of real centers and thus cause uncertainty and imprecision in the results. To address this problem, a new belief-based incomplete pattern unsupervised classification method (BPC) is proposed in this paper. Firstly, the complete patterns are grouped into a few clusters by a classical soft method like fuzzy c-means to obtain the corresponding reliable centers and thereby are partitioned into reliable patterns and unreliable ones by an optimization method. Secondly, a basic classifier trained by reliable patterns is employed to classifies unreliable patterns and the incomplete patterns edited by the neighbors. In this way, most of the edited incomplete patterns can be submitted to specific clusters. Finally, some ambiguous patterns will be carefully repartitioned again by a new distance-based rule depending on the obtained reliable centers and belief functions theory. By doing this, a few patterns that are very difficult to classify between different specific clusters will be reasonably submitted to meta-cluster which can characterize the uncertainty and imprecision of the clusters due to missing values. The simulation results show that the BPC has the potential to deal with real datasets.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.titleA New Belief-based Incomplete Pattern Unsupervised Classification Methoden_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.journalIEEE Transactions on Knowledge and Data Engineeringen_US
dc.identifier.doi10.1109/TKDE.2021.3049511
dc.identifier.cristin1867924
dc.description.localcode© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
cristin.ispublishedfalse
cristin.fulltextpostprint
cristin.qualitycode2


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