dc.contributor.author | Khandelwal, Sourabh | |
dc.contributor.author | Chauhan, Yogesh Singh | |
dc.contributor.author | Fjeldly, Tor A | |
dc.contributor.author | Ghosh, Sudip | |
dc.contributor.author | Pampori, Ahtisham | |
dc.contributor.author | Mahajan, Dhawal | |
dc.contributor.author | Dangi, Raghvendra | |
dc.contributor.author | Ahsan, Sheikh Aamir | |
dc.date.accessioned | 2020-05-14T13:35:17Z | |
dc.date.available | 2020-05-14T13:35:17Z | |
dc.date.created | 2019-01-14T16:21:14Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | IEEE Transactions on Electron Devices. 2019, 66 (1), 80-86. | en_US |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://hdl.handle.net/11250/2654511 | |
dc.description.abstract | We present the latest developments in Advance SPICE Model for GaN (ASM GaN) HEMTs in this paper. The ASM GaN model has been recently selected as an industry-standard compact model for GaN radio frequency (RF)and Power devices. The core Surface potential calculation and the modeling of real Device effects in this model are presented. We discuss the details of the nonlinear access region model and enhancement in this model to include a physical dependence on barrier thickness. We also present the novel model feature of configurable field-plate modeling and discuss the extraction procedure for the same. New results with the ASM GaN model on high-frequency and enhancement-mode GaN Power Devices are also presented. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.title | ASM GaN: Industry Standard Model for GaN RF and Power Devices – Part 1: DC, CV, and RF Model | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Journal article | en_US |
dc.description.version | publishedVersion | en_US |
dc.source.pagenumber | 80-86 | en_US |
dc.source.volume | 66 | en_US |
dc.source.journal | IEEE Transactions on Electron Devices | en_US |
dc.source.issue | 1 | en_US |
dc.identifier.doi | 10.1109/TED.2018.2867874 | |
dc.identifier.cristin | 1656623 | |
dc.description.localcode | This article will not be available due to copyright restrictions (c) 2019 by IEEE | en_US |
cristin.unitcode | 194,63,35,0 | |
cristin.unitname | Institutt for elektroniske systemer | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 2 | |