Vis enkel innførsel

dc.contributor.authorZhang, Qiuyuan
dc.contributor.authorPolikarpov, Maxim
dc.contributor.authorNataliya, Klimova
dc.contributor.authorLarsen, Helge Bøvik
dc.contributor.authorMathiesen, Ragnvald
dc.contributor.authorEmerich, Hermann
dc.contributor.authorThorkildsen, Gunnar
dc.contributor.authorSnigireva, Irina
dc.contributor.authorSnigirev, Anatoly
dc.date.accessioned2020-01-30T09:42:28Z
dc.date.available2020-01-30T09:42:28Z
dc.date.created2019-01-17T11:42:55Z
dc.date.issued2019
dc.identifier.citationAIP Conference Proceedings. 2019, 2054 (1), 1-6.nb_NO
dc.identifier.issn0094-243X
dc.identifier.urihttp://hdl.handle.net/11250/2638807
dc.description.abstractSingle-crystal diamond is considered as an ideal material for compound refractive lenses (usually abbreviated to “CRLs”) mainly due to its stability when bathed in strong X-ray radiation. Since CRLs come into operation by a refractive mechanism, it is imperative to study the transmission spectrum carefully. Many factors may influence the spectrum, including experimental features (such as beam divergence) and crystal orientation in this case. To verify initial assumptions, two experimental setups were realized - the energy scan and ω-scan. Both at BM31 station, ESRF. The results show that a number of glitches appear between 16 keV and 18 keV and the largest drop of intensity can reach up to approximately 40%. In this paper, we find that both positions and strengths of the predicted glitches are very sensitive to orientational correction, but that we in principle are able to predict them accurately when the real orientation is obtained.nb_NO
dc.language.isoengnb_NO
dc.publisherAIP Publishingnb_NO
dc.titleInvestigation of glitches induced by single-crystal diamond compound refractive lenses based on crystal orientationnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber1-6nb_NO
dc.source.volume2054nb_NO
dc.source.journalAIP Conference Proceedingsnb_NO
dc.source.issue1nb_NO
dc.identifier.doi10.1063/1.5084638
dc.identifier.cristin1659178
dc.description.localcodePublished by AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Journal of Applied Physics and may be found at https://doi.org/10.1063/1.5084638nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


Tilhørende fil(er)

Thumbnail

Denne innførselen finnes i følgende samling(er)

Vis enkel innførsel