Vis enkel innførsel

dc.contributor.authorBergh, Tina
dc.contributor.authorJohnstone, D.N.
dc.contributor.authorCrout, P
dc.contributor.authorHøgås, Simon
dc.contributor.authorMidgley, Paul A.
dc.contributor.authorHolmestad, Randi
dc.contributor.authorVullum, Per Erik
dc.contributor.authorVan Helvoort, Antonius
dc.date.accessioned2020-01-29T12:36:42Z
dc.date.available2020-01-29T12:36:42Z
dc.date.created2020-01-04T19:40:55Z
dc.date.issued2019
dc.identifier.issn0022-2720
dc.identifier.urihttp://hdl.handle.net/11250/2638614
dc.description.abstractScanning precession electron diffraction (SPED) enables the local crystallography of materials to be probed on the nanoscale by recording a two‐dimensional precession electron diffraction (PED) pattern at every probe position as a dynamically rocking electron beam is scanned across the specimen. SPED data from nanocrystalline materials commonly contain some PED patterns in which diffraction is measured from multiple crystals. To analyse such data, it is important to perform nanocrystal segmentation to isolate both the location of each crystal and a corresponding representative diffraction signal. This also reduces data dimensionality significantly. Here, two approaches to nanocrystal segmentation are presented, the first based on virtual dark‐field imaging and the second on non‐negative matrix factorization. Relative merits and limitations are compared in application to SPED data obtained from partly overlapping nanoparticles, and particular challenges are highlighted associated with crystals exciting the same diffraction conditions. It is demonstrated that both strategies can be used for nanocrystal segmentation without prior knowledge of the crystal structures present, but also that segmentation artefacts can arise and must be considered carefully. The analysis workflows associated with this work are provided open‐source.nb_NO
dc.language.isoengnb_NO
dc.publisherWileynb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleNanocrystal segmentation in scanning precession electron diffraction datanb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.journalJournal of Microscopynb_NO
dc.identifier.doihttps://doi.org/10.1111/jmi.12850
dc.identifier.cristin1766294
dc.relation.projectNorges forskningsråd: 197405nb_NO
dc.description.localcode© 2019 The Authors. Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedfalse
cristin.fulltextpreprint
cristin.qualitycode1


Tilhørende fil(er)

Thumbnail

Denne innførselen finnes i følgende samling(er)

Vis enkel innførsel

Navngivelse 4.0 Internasjonal
Med mindre annet er angitt, så er denne innførselen lisensiert som Navngivelse 4.0 Internasjonal