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dc.contributor.authorTominaga, Shoji
dc.contributor.authorGuarnera, Giuseppe Claudio
dc.date.accessioned2020-01-20T07:54:44Z
dc.date.available2020-01-20T07:54:44Z
dc.date.created2019-10-30T11:39:08Z
dc.date.issued2019
dc.identifier.citationFinal program and proceedings (Color and Imaging Conference). 2019, 279-283.nb_NO
dc.identifier.issn2166-9635
dc.identifier.urihttp://hdl.handle.net/11250/2636903
dc.description.abstractA method is proposed for measuring, modeling, and reproducing material appearance from the specular profile representing reflectance distribution around a specular highlight. Our method is aimed at opaque materials with a highly glossy surface like plastic, ceramic, and metals. Hence, the material surface is assumed to be not a perfect mirror, but a surface with some roughness. We do not use a gonio-spectrophometer nor an image-based measurement setup. Instead, we make use of a gloss meter with a function to measure the specular profile, containing for glossy materials appearance such as roughness, sharpness, and intensity. The surface reflection is represented as a linear sum of diffuse and specular reflection components, the latter described by the Cook-Torrance model. The specular function represents the glossy surface appearance by a small number of control parameters. Mitsuba rendering system is utilized to perform the rendering algorithms. Finally, the feasibility of the proposed method is examined using different materials.nb_NO
dc.language.isoengnb_NO
dc.publisherSociety for Imaging Science and Technologynb_NO
dc.titleMeasuring, Modeling, and Reproducing Material Appearance from Specular Profilenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber279-283nb_NO
dc.source.journalFinal program and proceedings (Color and Imaging Conference)nb_NO
dc.identifier.doi10.2352/issn.2169-2629.2019.27.50
dc.identifier.cristin1742157
dc.description.localcodeThis article will not be available due to copyright restrictions (c) 2019 by Society for Imaging Science and Technologynb_NO
cristin.unitcode194,63,10,0
cristin.unitnameInstitutt for datateknologi og informatikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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