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dc.contributor.authorEllingsen, Pål Gunnar
dc.contributor.authorLilledahl, Magnus Borstad
dc.contributor.authorAas, Lars Martin Sandvik
dc.contributor.authorDavies, Catharina De Lange
dc.contributor.authorKildemo, Morten
dc.date.accessioned2019-10-11T11:29:39Z
dc.date.available2019-10-11T11:29:39Z
dc.date.created2012-01-06T17:24:47Z
dc.date.issued2011
dc.identifier.citationJournal of Biomedical Optics. 2011, 16 (11), 116002-1-116002-6.nb_NO
dc.identifier.issn1083-3668
dc.identifier.urihttp://hdl.handle.net/11250/2621602
dc.description.abstractThe collagen meshwork in articular cartilage of chicken knee is characterized using Mueller matrix imaging and multiphoton microscopy. Direction and degree of dispersion of the collagen fibers in the superficial layer are found using a Fourier transform image-analysis technique of the second-harmonic generated image. Mueller matrix images are used to acquire structural data from the intermediate layer of articular cartilage where the collagen fibers are too small to be resolved by optical microscopy, providing a powerful multimodal measurement technique. Furthermore, we show that Mueller matrix imaging provides more information about the tissue compared to standard polarization microscopy. The combination of these techniques can find use in improved diagnosis of diseases in articular cartilage, improved histopathology, and additional information for accurate biomechanical modeling of cartilage.nb_NO
dc.language.isoengnb_NO
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)nb_NO
dc.relation.urihttp://spiedigitallibrary.org/jbo/resource/1/jbopfo/v16/i11/p116002_s1
dc.titleQuantitative characterization of articular cartilage using Mueller matrix imaging and multiphoton microscopynb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber116002-1-116002-6nb_NO
dc.source.volume16nb_NO
dc.source.journalJournal of Biomedical Opticsnb_NO
dc.source.issue11nb_NO
dc.identifier.doi10.1117/1.3643721
dc.identifier.cristin879071
dc.description.localcode© 2011 Society of Photo-Optical Instrumentation Engineers (SPIE) . Open Accessnb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2


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