• norsk
    • English
  • norsk 
    • norsk
    • English
  • Logg inn
Vis innførsel 
  •   Hjem
  • Øvrige samlinger
  • Publikasjoner fra CRIStin - NTNU
  • Vis innførsel
  •   Hjem
  • Øvrige samlinger
  • Publikasjoner fra CRIStin - NTNU
  • Vis innførsel
JavaScript is disabled for your browser. Some features of this site may not work without it.

Model-Based Identification of Nanomechanical Properties in Atomic Force Microscopy: Theory and Experiments

Ragazzon, Michael Remo Palmén; Gravdahl, Jan Tommy; Pettersen, Kristin Ytterstad
Journal article, Peer reviewed
Accepted version
Thumbnail
Åpne
Ragazzon (906.8Kb)
Permanent lenke
http://hdl.handle.net/11250/2595314
Utgivelsesdato
2018
Metadata
Vis full innførsel
Samlinger
  • Institutt for teknisk kybernetikk [2849]
  • Publikasjoner fra CRIStin - NTNU [26648]
Originalversjon
10.1109/TCST.2018.2847644
Sammendrag
The ability of the atomic force microscope (AFM) to resolve highly accurate interaction forces has made it an increasingly popular tool for determining nanomechanical properties of soft samples. Traditionally, elasticity is determined by gathering force-distance curves. More recently, dynamic properties such as viscoelasticity can be determined by relating the observables to sample properties, either by singlefrequency or multifrequency modulation of the cantilever. In this paper, a model-based technique for resolving nanomechanical properties is presented. Both the sample and cantilever are represented by dynamic models. A recursive least squares method is then employed to identify the unknown parameters of the sample model, thus revealing its nanomechanical properties. Two sample models are presented in this paper, demonstrating the ability to swap sample models to best suit the material being studied. The method has been experimentally implemented on a commercial AFM for online estimation of elastic moduli, spring constants, and damping coefficients. In addition, the experimental results demonstrate the capability of measuring time- or space-varying parameters using the presented approach.
Utgiver
Institute of Electrical and Electronics Engineers (IEEE)
Tidsskrift
IEEE Transactions on Control Systems Technology

Kontakt oss | Gi tilbakemelding

Personvernerklæring
DSpace software copyright © 2002-2019  DuraSpace

Levert av  Unit
 

 

Bla i

Hele arkivetDelarkiv og samlingerUtgivelsesdatoForfattereTitlerEmneordDokumenttyperTidsskrifterDenne samlingenUtgivelsesdatoForfattereTitlerEmneordDokumenttyperTidsskrifter

Min side

Logg inn

Statistikk

Besøksstatistikk

Kontakt oss | Gi tilbakemelding

Personvernerklæring
DSpace software copyright © 2002-2019  DuraSpace

Levert av  Unit